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Transitions radiatives du cœur à la bande de valence dans les cristaux CsCl et CsCaCl2MEL'CHAKOV, E.N; RODNYJ, P.A; RYBAKOV, B.V et al.Fizika tverdogo tela. 1989, Vol 31, Num 5, pp 276-278, issn 0367-3294Article

ON THE USE OF AN ELECTRON SPECTROMETER AS DETECTOR FOR SOFT X-RAY SPECTRAEBEL MF.1975; X-RAY SPECTROM.; G.B.; DA. 1975; VOL. 4; NO 1; PP. 43-46; BIBL. 6 REF.Article

X-RAY PHOTOELECTRON SPECTROSCOPY OF GLASS IN THEORY AND EXPERIMENTSTEPHENSON DA; BINKOWSKI NJ.1975; J. NON-CRYST. SOLIDS; NETHERL.; DA. 1975; VOL. 19; PP. 87-88; (GLASS SURF. ROLLA CERAM. MATER. CONF. GLASS SURF. 4. PROC.; ST. LOUIS, MO.; 1975)Conference Paper

Surface quantitative analysis of Cr-O systems by XPSBATTISTONI, C; COSSU, G; MATTOGNO, G et al.Surface and interface analysis. 1983, Vol 5, Num 4, pp 173-176, issn 0142-2421Article

X-ray absorption and X-ray photoelectron spectroscopy of a rhodium colloidROTHE, J; POLLMANN, J; FRANKE, R et al.Fresenius' journal of analytical chemistry. 1996, Vol 355, Num 3-4, pp 372-374, issn 0937-0633Conference Paper

Quantitative XPS analysis considering elastic scatteringEBEL, H; EBEL, M. F; WERNISCH, J et al.Surface and interface analysis. 1984, Vol 6, Num 3, pp 140-143, issn 0142-2421Article

Metal overlayers on organic functional groups of self-organized molecular assemblies. II: X-ray photoelectron spectroscopy of interactions of Cu/CN on 12-mercaptododecanenitrileJUNG, D. R; KING, D. E; CZANDERNA, A. W et al.Journal of vacuum science and technology. A. Vacuum, surfaces, and films. 1993, Vol 11, Num 4, pp 2382-2386, issn 0734-2101, 2Conference Paper

XPS: energy calibration of electron spectrometers. II: Results of an interlaboratory comparisonANTHONY, M. T; SEAH, M. P.Surface and interface analysis. 1984, Vol 6, Num 3, pp 107-115, issn 0142-2421Article

RELATIVE PHOTOELECTRON SIGNAL INTENSITIES OBTAINED WITH A MAGNESIUM X-RAY SOURCEBERTHOU H; JORGENSEN CK.1975; ANAL. CHEM.; U.S.A.; DA. 1975; VOL. 47; NO 3; PP. 482-488; BIBL. 15 REF.Article

X-RAY PHOTOELECTRON SPECTROSCOPY (ESCA), A CHEMICAL AND SURFACE ANALYSIS METHODVAN DER KELEN G.1975; SILIC. INDUSTR.; BELG.; DA. 1975; VOL. 40; NO 3; PP. 75-80; ABS. FR. ALLEM.; BIBL. 11 REF.Article

APPLICATIONS OF PHOTOELECTRON SPECTROSCOPY TO ANALYTICAL CHEMISTRYCHENG KL; PRATHER JW II.1975; C.R.C. CRIT. REV. ANAL. CHEM.; U.S.A.; DA. 1975; VOL. 5; NO 1; PP. 37-84; BIBL. 3 P. 1/2Article

X-RAY PHOTOELECTRON SPECTROSCOPIC STUDIES OF PBO SURFACES BOMBARDED WITH HE+, NE+, AR+, XE+ AND KR+KIM KS; BAITINGER WE; WINOGRAD N et al.1976; SURF. SCI.; NETHERL.; DA. 1976; VOL. 55; NO 1; PP. 285-290; BIBL. 16 REF.Article

QUANTITATIVE SURFACE ANALYSIS BY X-RAY PHOTOELECTRON SPECTROSCOPY (ESCA)SWINGLE RS II.1975; ANAL. CHEM.; U.S.A.; DA. 1975; VOL. 47; NO 1; PP. 21-24; BIBL. 30 REF.Article

AUGER PARAMETER IN ELECTRON SPECTROSCOPY FOR THE IDENTIFICATION OF CHEMICAL SPECIESWAGNER CD.1975; ANAL. CHEM.; U.S.A.; DA. 1975; VOL. 47; NO 7; PP. 1201-1203; BIBL. 7 REF.Article

APPLICATION DE L'ESCA A L'ETUDE D'OXYDES A BASE DE COBALTBONNELLE JP; GRIMBLOT J; D'HUYSSER A et al.1975; VIDE; FR.; DA. 1975; VOL. 30; NO 176; PP. 86-87; ABS. ANGL.; BIBL. 6 REF.Article

ELECTRON SPECTROSCOPY WITH MONOCHROMATIZED X-RAYS. THIS TECHNIQUE CONSTITUES A SECOND-GENERATION APPROACH FOR A NEW ANALYTICAL METHODSIEGBAHN K; HAMMOND D; FELLNER FELDEGG H et al.1972; SCIENCE; U.S.A.; DA. 1972; VOL. 176; NO 4032; PP. 245-252; BIBL. 12 REF.Serial Issue

Surface characterization of chrysotile asbestos by X-ray photoelectron spectroscopy and scanning Auger spectroscopyPATHAK, B; SEBASTIEN, P.Canadian journal of spectroscopy. 1985, Vol 30, Num 1, pp 1-6, issn 0045-5105Article

Effects of elastic photoelectron collisions in quantitative XPSJABLONSKI, A; EBEL, H.Surface and interface analysis. 1984, Vol 6, Num 1, pp 21-28, issn 0142-2421Article

XPS: energy calibration of electron spectrometers. I: An absolute, traceable energy calibration and the provision of atomic reference line energiesANTHONY, M. T; SEAH, M. P.Surface and interface analysis. 1984, Vol 6, Num 3, pp 95-106, issn 0142-2421Article

X-ray photoelectron spectroscopy study of the surface composition of CoO-MgO solid solutionsCIMINO, A; DE ANGELIS, B. A; MINELLI, G et al.Surface and interface analysis. 1983, Vol 5, Num 4, pp 150-154, issn 0142-2421Article

The antioxidation effect of boron oxide on a pyocarbonCHESNEAU, M; BEGUIN, F; CONARD, J et al.Carbon (New York, NY). 1992, Vol 30, Num 4, pp 714-716, issn 0008-6223Article

He(I) photoelectron studies of lidocaine films on liquid surfacesBALLARD, R. E; JONES, J; READ, D et al.Chemical physics letters. 1988, Vol 144, Num 2, pp 114-118, issn 0009-2614Article

Quantitative surface analysis by XPS: a comparison among different quantitative approachesBATTISTONI, C; MATTOGNO, G; PAPARAZZO, E et al.Surface and interface analysis. 1985, Vol 7, Num 3, pp 117-121, issn 0142-2421Article

Small area X-ray photoelectron spectroscopyYATES, K; WEST, R. H.Surface and interface analysis. 1983, Vol 5, Num 5, pp 217-221, issn 0142-2421Article

Surface modification and characterization of carbon black with oxygen plasmaTAKADA, T; NAKAHARA, M; KUMAGAI, H et al.Carbon (New York, NY). 1996, Vol 34, Num 9, pp 1087-1091, issn 0008-6223Article

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